Built-in Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays
نویسندگان
چکیده
We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the block random access memories (RAMs) in all of their modes of operation including singleand dual-port RAM, first-in first-out (FIFO), error correcting code (ECC), and cascade modes of operation. The BIST architecture and configurations needed to test these block RAMs are presented with implementation, fault detection, and timing analysis.
منابع مشابه
BIST for Logic and Memory Resources in Virtex-4 FPGAs
We present a Built-In Self-Test (BIST) approach for testing and diagnosing the programmable logic and memory resources in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The resources under test include the programmable logic blocks (PLBs) and block random access memories (RAMs) in all of their modes of operation. The BIST architecture and configurations needed to completely test...
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.......................................................................................................................................... ii Acknowledgments.......................................................................................................................... iv List of Tables ......................................................................................................
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........................................................................................................ii Acknowledgements..........................................................................................iii List of Tables.................................................................................................vii List of Figures.....................................................
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